Secrets of Near and Far Field Scanning

In this webinar, Prof. Arturo Mediano will review the fundamentals of Near Field Scanning to debug EMI/EMC problems.

Learning takeaways: 

  • Learn how to analyze and resolve the EMI/EMC issues in a real-time set up (with a DC/DC converter, a microcontroller board, LCD and RFID blocks).
    The setup includes interconnecting cables which will also be analyzed for Common Mode Emissions and determined the efficiency of Ferrites to minimize the currents running through the cables.  
  • Learn how EMScanner can be beneficial for analyzing small components (ICs) and small-high populated PCBs

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Improve Shielding Effectiveness by Near Field Scanning