Near Field Probe Kit

 Powerful near-field H probes for EMC/EMI troubleshooting

Near Field Probe Kit


The Near Field Probe (NFP) Kit helps enhance product testing with reliable and accurate live scanning for highlighting EMC & EMI issues.

The probes are used to locate, identify, measure, and characterize potential sources of electromagnetic radiation.

Designed by Y.I.C. Technologies, the NFP Kit is designed for measuring near-field emissions for EMC/EMI troubleshooting and pre-compliance testing. Interference radiated from traces or components of electronic PCBs, assemblies, cables, enclosures, or products can also be located. The probe output is proportional to the magnetic field (H) strength present at the probe location.

Ideal PCB projects for EMScanner are boards designed for high speed, high power, and/or high density/complexity. Any PCB that places a premium onboard real estate also qualifies as an excellent candidate. The compact, flat scanner provides PCB design teams with an easy-to-use, cost-effective, and proven tabletop solution. Emission, immunity, filtering, EMI shielding, broadband noise, and Common Mode testing are some of the applications that the EMScanner system addresses in mere seconds.

Emscanner All

Product Features  

Fully integrated with Y.I.C. Technologies EMViewer software and EMProbe

Normalization and correction when using the EMViewer software

Flat response within the range of operation

Slim Design and Protective Coating

18GHz Measured Cable included

    Check out NFPKit Resources for more information.